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Lapp Technologies focuses on Test and Failure Analysis equipment for Semiconductor design and manufacturing environments.

Representing:

Hamamatsu
Semiconductor failure analysis microscopes.

  • Emission Microscopy
  • Laser Stimulation (Obirch)
  • Thermal Detection
  • Optical Probing (EOP/EOFM)

International Test Solutions
In situ Yield Enhancement Products

  • Fabrication
  • Wafer Sort
  • Final Test

Integrated Technology Corporation
Probilt Probe Card Analysis Tools

Robson Technologies Inc
Test Fixturing Including Interconnects and Interfaces

  • Custom Sockets
  • Custom PCBs
  • Custom Mechanical/Electrical Integration

HTT
WID series OCR cameras

  • Can be field retrofitted to most tools presently using OCR

RKD Engineering
Sample preparation equipment

  • Mechanical decapsulation
  • Chemical decapsulation

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